Microscopy and Visual Inspection
The laboratory boasts a wide range of microscopes that can be used for both visual inspection as well as analysis. We have a team of highly competent engineers that are happy to train you how to use the equipment yourself or to look at your samples for you. We can provide measurements of features, failure analysis (including fractography) as well as defect concentrations and much more.
What we can offer
Microscopy
The laboratory has multiple tabletop optical microscopes available with many of them connected to software for measurement and analysis.
- Zeiss Axio Observer
- Zeiss AxioCam 208
- Olympus DSX 510
- ASH Omni 3
- AFM Park XE7
- Nikon Eclipse L200N Microscope
SEM (Scanning Electron Microscopy)
Our laboratory operates multiple SEM systems with integrated EDX, EBSD (See Surface/Microstructural Characterisation Section), InLens, Backscatter and Secondary Electron detectors. We deliver detailed morphological and elemental insights essential for space component qualification and failure diagnostics.
Our SEM systems available:
- Zeiss EVO15 VP
- Zeiss Sigma 300
- Zeiss EVO60
- Zeiss Leo 1530
- Hitachi TM3030
Metrology
Our team has extensive knowledge in metrology and the laboratory boasts various pieces of equipment to help you in your analysis:
- Bruker Alicona Surface Measurement
- Optical 3D measuring device
- Horiba Ellipsometer
- Thin Film Analyzer- Ellipsometer
- Bruker Dektak
- Mechanical Profilometer
- Filmetrics F40-UV
- Thin Film Analyzer- Optical Reflectometer
- Zygo nex view
- White Light Scan Interferometer
- Tencor P7
- Mechanical Profilometer
- FT110 XRF coating gauge
- Metal Coating Thickness Gauge
