Material, Surface and Microstructural Characterisation
We can provide detailed material characterisation to support material development, process qualification, quality control and failure analysis. Using advanced sample preparation and microscopy techniques, we examine features from the macroscale including the surface topography, grain structure, phase distribution and chemical composition.
What we can offer
EDX/EBSD
We use electron microscope techniques to characterise the microstructure, crystallography and chemical properties of materials.
Energy Dispersive X-Ray Spectroscopy (EDX/EDS): Elemental analysis and mapping to determine chemical composition, useful for identifying contamination within your sample.
Electron Backscatter Diffraction (EBSD): Crystallographic orientation mapping, phase identification and texture analysis, useful for measuring the crystallographic orientation and grain size of individual constituent grains.
XRD
We use X-ray Diffraction (XRD) to identify and quantify crystalline phases, evaluate crystal structure and analyse texture in materials. XRD can also provide insight into phase composition, lattice parameters and materials transformation in metals, ceramics, powder and coating.
Thermal Conductivity
Using our Hot Disk TPS 2500 S, we can provide you with information regarding thermal conductivity. This system uses the Transient Plane Source (TPS) method to provide precise data on the thermal transport properties of your samples.
Specs:
- Thermal Conductivity: 0.005 to 1800 W/m/K
- Thermal Diffusivity: 0.1 to 1200mm2s-1
- Specific Heat Capacity: Up to 5 MJ/m3K
- Temperature Range: -253°C to 1000°C
